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Complex pulsed field magnetization behavior and Walker breakdown in a NiFe thin-film

Burn, D.M.; Atkinson, D.

Complex pulsed field magnetization behavior and Walker breakdown in a NiFe thin-film Thumbnail


Authors

D.M. Burn

D. Atkinson



Abstract

The magnetization behavior of a Permalloy thin-film (nominally Ni81Fe19) was investigated as a function of combined quasistatic and pulsed magnetic fields measured using magneto-optic Kerr effect magnetometry. We observed complex field dependent switching behavior that depends on the relative contributions to the total field of the quasistatic and pulsed fields. As the pulsed field amplitude was increased, complex switching behavior occurs for total fields in excess of the coercive field. A simple phenomenological domain wall propagation model suggests a qualitative understanding of this complex behavior based on Walker breakdown of the domain wall motion occurring in the Permalloy thin-film.

Citation

Burn, D., & Atkinson, D. (2010). Complex pulsed field magnetization behavior and Walker breakdown in a NiFe thin-film. Journal of Applied Physics, 108(7), Article 073926. https://doi.org/10.1063/1.3490233

Journal Article Type Article
Publication Date Oct 1, 2010
Deposit Date Nov 2, 2010
Publicly Available Date Mar 28, 2024
Journal Journal of Applied Physics
Print ISSN 0021-8979
Electronic ISSN 1089-7550
Publisher American Institute of Physics
Peer Reviewed Peer Reviewed
Volume 108
Issue 7
Article Number 073926
DOI https://doi.org/10.1063/1.3490233
Keywords Coercive force, Ferromagnetic materials, Kerr magneto-optical effect, Magnetic domain walls, Magnetic switching, Magnetic thin films, Metallic thin films, Permalloy.

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Published Journal Article (177 Kb)
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Copyright Statement
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Burn, D.M. and Atkinson, D. (2010) 'Complex pulsed field magnetization behavior and Walker breakdown in a NiFe thin-film.', Journal of applied physics., 108 (7). 073926 and may be found at http://dx.doi.org/10.1063/1.3490233




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