Pym, A.T.G. and Ruhrig, M. and Tanner, B.K. (2010) 'Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing.', Journal of applied physics., 107 (9). 093524.
Sputtered multilayers of Co0.6Fe0.2B0.2 and AlOx have been measured using grazing incidence x-ray scattering to determine the changes in layer and interface structure during in situ annealing. We confirm our earlier deduction of a sharpening of the interfaces on annealing up to 400 °C. This sharpening arises from reduction in chemical intermixing, not from change in topological roughness and provides an explanation for the enhanced tunneling magnetoresistance. The annealing is shown to result in a decrease in Co0.6Fe0.2B0.2 mean layer thickness and increase in the layer density. There is a commensurate increase in AlOx mean layer thickness while at the same time there is a reduction in the layer density. The increase in thickness could explain the corresponding increase observed in the resistance-area product.
|Keywords:||Magnetic tunnel-junctions, Room-temperature, AL203 barriers, Aluminium compounds, Annealing, Cobalt compounds, Magnetoresistance, Ferromagnetic materials, Interface roughness, Interface structure, Iron compounds, Magnetic multilayers, X-ray scattering.|
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|Publisher Web site:||http://dx.doi.org/10.1063/1.3366707|
|Publisher statement:||Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Pym, A.T.G. and Ruhrig, M. and Tanner, B.K. (2010) 'Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing.', Journal of applied physics., 107 (9). 093524 and may be found at http://dx.doi.org/10.1063/1.3366707|
|Record Created:||27 Sep 2012 15:05|
|Last Modified:||09 Oct 2012 14:23|
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