Total internal reflection Raman spectroscopy

Woods, David A.; Bain, Colin D.

doi:10.1039/c1an15722a

Total internal reflection Raman spectroscopy

Woods, David A.; Bain, Colin D.

Authors

David A. Woods

Colin D. Bain

Abstract

Total internal reflection (TIR) Raman spectroscopy is an experimentally straightforward, surface-sensitive technique for obtaining chemically specific spectroscopic information from a region within approximately 100–200 nm of a surface. While TIR Raman spectroscopy has long been overshadowed by surface-enhanced Raman scattering, with modern instrumentation TIR Raman spectra can be acquired from sub-nm thick films in only a few seconds. In this review, we describe the physical basis of TIR Raman spectroscopy and illustrate the performance of the technique in the diverse fields of surfactant adsorption, liquid crystals, lubrication, polymer films and biological interfaces, including both macroscopic structures such as the surfaces of leaves, and microscopic structures such as lipid bilayers. Progress, and challenges, in using TIR Raman to obtain depth profiles with sub-diffraction resolution are described.

Citation

Woods, D. A., & Bain, C. D. (2012). Total internal reflection Raman spectroscopy. Analyst, 137(1), 35-48. https://doi.org/10.1039/c1an15722a

Journal Article Type	Article
Publication Date	Jan 7, 2012
Deposit Date	Nov 14, 2013
Publicly Available Date	Nov 14, 2014
Journal	Analyst
Print ISSN	0003-2654
Electronic ISSN	1364-5528
Publisher	Royal Society of Chemistry
Peer Reviewed	Peer Reviewed
Volume	137
Issue	1
Pages	35-48
DOI	https://doi.org/10.1039/c1an15722a