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Surfactant Adsorption Kinetics by Total Internal Reflection Raman Spectroscopy. 1. Pure Surfactants on Silica

Woods, David A.; Petkov, Jordan; Bain, Colin D.

Surfactant Adsorption Kinetics by Total Internal Reflection Raman Spectroscopy. 1. Pure Surfactants on Silica Thumbnail


Authors

David A. Woods

Jordan Petkov

Colin D. Bain



Abstract

Total internal reflection Raman spectroscopy provides a sensitive probe of surfactants adsorbed at an interface. A visible laser passes through a silica hemisphere and reflects off the flat silica–water interface. An evanescent wave probes 100 nm of solution below the surface, and the Raman scattering from this region provides chemically specific information on the molecules present. Here we look at both equilibrium and kinetic aspects of the adsorption of the cationic surfactant cetyltrimethylammonium bromide (CTAB) and the nonionic surfactant Triton X-100 in single-component systems. We use the well-defined wall jet geometry to provide known hydrodynamics for the adsorption process. The well-defined hydrodynamics allows us to model the mass transport of surfactant to the surface which is coupled with a kinetic model consistent with the Frumkin isotherm to produce a complete model of the adsorption process. The fit between this model and the experimental results provides insight into the interactions on the surface.

Citation

Woods, D. A., Petkov, J., & Bain, C. D. (2011). Surfactant Adsorption Kinetics by Total Internal Reflection Raman Spectroscopy. 1. Pure Surfactants on Silica. Journal of Physical Chemistry B (Soft Condensed Matter and Biophysical Chemistry), 115(22), 7341-7352. https://doi.org/10.1021/jp201338s

Journal Article Type Article
Publication Date Jun 9, 2011
Deposit Date Nov 14, 2013
Publicly Available Date Feb 5, 2014
Journal Journal of Physical Chemistry B (Soft Condensed Matter and Biophysical Chemistry)
Print ISSN 1520-6106
Electronic ISSN 1520-5207
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 115
Issue 22
Pages 7341-7352
DOI https://doi.org/10.1021/jp201338s

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Accepted Journal Article (469 Kb)
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Copyright Statement
This document is the Accepted Manuscript version of a Published Work that appeared in final form in Journal of physical chemistry B, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see http://dx.doi.org/10.1021/jp201338s




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