Defect motifs for constant mean curvature surfaces

Kusumaatmaja, H.; Wales, D.J.

doi:10.1103/physrevlett.110.165502

Defect motifs for constant mean curvature surfaces

Kusumaatmaja, H.; Wales, D.J.

Authors

Professor Halim Kusumaatmaja halim.kusumaatmaja@durham.ac.uk
Professor

D.J. Wales

Abstract

The energy landscapes of electrostatically charged particles embedded on constant mean curvature surfaces are analyzed for a wide range of system size, curvature, and interaction potentials. The surfaces are taken to be rigid, and the basin-hopping method is used to locate the putative global minimum structures. The defect motifs favored by potential energy agree with experimental observations for colloidal systems: extended defects (scars and pleats) for weakly positive and negative Gaussian curvatures, and isolated defects for strongly negative Gaussian curvatures. Near the phase boundary between these regimes, the two motifs are in strong competition, as evidenced from the appearance of distinct funnels in the potential energy landscape. We also report a novel defect motif consisting of pentagon pairs.

Citation

Kusumaatmaja, H., & Wales, D. (2013). Defect motifs for constant mean curvature surfaces. Physical Review Letters, 110(16), Article 165502. https://doi.org/10.1103/physrevlett.110.165502

Journal Article Type	Article
Publication Date	Apr 1, 2013
Deposit Date	May 9, 2013
Publicly Available Date	Jul 11, 2014
Journal	Physical Review Letters
Print ISSN	0031-9007
Electronic ISSN	1079-7114
Publisher	American Physical Society
Peer Reviewed	Peer Reviewed
Volume	110
Issue	16
Article Number	165502
DOI	https://doi.org/10.1103/physrevlett.110.165502

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Reprinted with permission from the American Physical Society: Phys. Rev. Lett. 110, 165502 © (2013) by the American Physical Society. Readers may view, browse, and/or download material for temporary copying purposes only, provided these uses are for noncommercial personal purposes. Except as provided by law, this material may not be further reproduced, distributed, transmitted, modified, adapted, performed, displayed, published, or sold in whole or part, without prior written permission from the American Physical Society.