Electrical Behavior of Langmuir–Blodgett Networks of Sorted Metallic and Semiconducting Single-Walled Carbon Nanotubes

Massey, M.K.; Rosamond, M.C.; Pearson, C.; Zeze, D.A.; Petty, M.C.

doi:10.1021/la3031232

Electrical Behavior of Langmuir–Blodgett Networks of Sorted Metallic and Semiconducting Single-Walled Carbon Nanotubes

Massey, M.K.; Rosamond, M.C.; Pearson, C.; Zeze, D.A.; Petty, M.C.

Authors

M.K. Massey

M.C. Rosamond

C. Pearson

Professor Dagou Zeze d.a.zeze@durham.ac.uk
Professor

M.C. Petty

Abstract

Langmuir–Blodgett deposition has been used to form thin film networks of both metallic and semiconducting single-walled carbon nanotubes. These have been investigated to understand their physical, optical, and morphological properties. The electrical conductivities over the temperature range 80–350 K and across electrode gaps of 220 nm and 2 mm have been explored. In the case of semiconducting tubes, the results suggest that Poole–Frenkel conduction is the dominant electrical process at temperatures below 150 K and electric fields of greater than 1 MV m–1. Metallic nanotube networks exhibit a decrease in resistance with a reduction in temperature. This can be approximated by a linear relationship, giving a temperature coefficient of resistance of 10–3 K–1.

Citation

Massey, M., Rosamond, M., Pearson, C., Zeze, D., & Petty, M. (2012). Electrical Behavior of Langmuir–Blodgett Networks of Sorted Metallic and Semiconducting Single-Walled Carbon Nanotubes. Langmuir, 28(43), 15385-15391. https://doi.org/10.1021/la3031232

Journal Article Type	Article
Publication Date	Oct 30, 2012
Deposit Date	Feb 19, 2014
Publicly Available Date	Jul 30, 2014
Journal	Langmuir
Print ISSN	0743-7463
Electronic ISSN	1520-5827
Publisher	American Chemical Society
Peer Reviewed	Peer Reviewed
Volume	28
Issue	43
Pages	15385-15391
DOI	https://doi.org/10.1021/la3031232

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Copyright Statement
This document is the Accepted Manuscript version of a Published Work that appeared in final form in Langmuir, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see: http://pubs.acs.org/doi/abs/10.1021/la3031232.