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Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures.

Lafford, T. A. and Parbrook, P. J. and Tanner, B. K. (2003) 'Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures.', Applied physics letters., 83 (26). pp. 5434-5436.

Abstract

High-resolution x-ray diffraction, in surface symmetric, skew symmetric, and grazing incidence in-plane diffraction geometries, has been used to investigate the effect of an AlN interlayer between micron thick GaN and AlxGa1–xN layers grown by metalorganic vapor phase epitaxy on basal plane sapphire. No change is found in the tilt mosaic (threading screw dislocation density) with thickness or Al fraction x of the upper layer. A linear increase in the twist mosaic (threading edge dislocation density) was observed as a function of interlayer thickness and x. For all samples the twist mosaic of the AlGaN was significantly greater, by at least a factor of two, than that of the GaN layer. With increasing interlayer thickness the in-plane lattice parameter of the AlGaN decreased. The results are explained in terms of extra threading edge dislocations resulting from relaxation at the GaN/AlN interface.

Item Type:Article
Keywords:Aluminium compounds, Gallium compounds, III-V semiconductors, Wide band gap semiconductors, X-ray diffraction, Semiconductor heterojunctions, Tilt boundaries, Twist boundaries, MOCVD coatings, Vapour phase epitaxial growth, Semiconductor growth.
Full text:PDF - Published Version (55Kb)
Status:Peer-reviewed
Publisher Web site:http://dx.doi.org/10.1063/1.1637717
Publisher statement:Copyright (2003) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Lafford, T. A. and Parbrook, P. J. and Tanner, B. K. (2003) 'Influence of alloy composition and interlayer thickness on twist and tilt mosaic in AlxGa1-xN/AlN/GaN heterostructures.', Applied physics letters., 83 (26). pp. 5434-5436. and may be found at http://link.aip.org/link/?apl/83/5434
Record Created:09 Jan 2009
Last Modified:21 Apr 2011 14:08

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