Measurement of propagation constant in waveguides with wideband coherent terahertz spectroscopy

Hadjiloucas, S.; Galvao, R.K.H.; Bowen, J.W.; Martini, R.; Brucherseifer, M.; Pellemans, H.P.M.; Bolivar, P.H.; Kurz, H.; Digby, J.; Parkhurst, G.M.; Chamberlain, J.M.

doi:10.1364/josab.20.000391

Measurement of propagation constant in waveguides with wideband coherent terahertz spectroscopy

Hadjiloucas, S.; Galvao, R.K.H.; Bowen, J.W.; Martini, R.; Brucherseifer, M.; Pellemans, H.P.M.; Bolivar, P.H.; Kurz, H.; Digby, J.; Parkhurst, G.M.; Chamberlain, J.M.

Authors

S. Hadjiloucas

R.K.H. Galvao

J.W. Bowen

R. Martini

M. Brucherseifer

H.P.M. Pellemans

P.H. Bolivar

H. Kurz

J. Digby

G.M. Parkhurst

J.M. Chamberlain

Abstract

A quasi-optical technique for characterizing micromachined waveguides is demonstrated with wideband time-resolved terahertz spectroscopy. A transfer-function representation is adopted for the description of the relation between the signals in the input and output port of the waveguides. The time-domain responses were discretized, and the waveguide transfer function was obtained through a parametric approach in the z domain after describing the system with an autoregressive with exogenous input model. The a priori assumption of the number of modes propagating in the structure was inferred from comparisons of the theoretical with the measured characteristic impedance as well as with parsimony arguments. Measurements for a precision WR-8 waveguide-adjustable short as well as for G-band reduced-height micromachined waveguides are presented.

Citation

Hadjiloucas, S., Galvao, R., Bowen, J., Martini, R., Brucherseifer, M., Pellemans, H., …Chamberlain, J. (2003). Measurement of propagation constant in waveguides with wideband coherent terahertz spectroscopy. Journal of the Optical Society of America B, 20(2), 391-401. https://doi.org/10.1364/josab.20.000391

Journal Article Type	Article
Publication Date	2003-05
Deposit Date	Jan 4, 2007
Publicly Available Date	Nov 10, 2010
Journal	Journal of the Optical Society of America B
Print ISSN	0740-3224
Electronic ISSN	1520-8540
Publisher	Optica
Peer Reviewed	Peer Reviewed
Volume	20
Issue	2
Pages	391-401
DOI	https://doi.org/10.1364/josab.20.000391
Keywords	Optical devices, Waveguides, Spectroscopy, Far infrared, Thin films, Ultrafast optics, Pulse shaping, Microwaves.