Cookies

We use cookies to ensure that we give you the best experience on our website. You can change your cookie settings at any time. Otherwise, we'll assume you're OK to continue.


Durham Research Online
You are in:

The distribution of impurities in the interfaces and window layers of thin-film solar cells.

Emziane, M. and Durose, K. and Halliday, D. P. and Romeo, N. and Bosio, A. (2005) 'The distribution of impurities in the interfaces and window layers of thin-film solar cells.', Journal of applied physics., 97 (11). p. 114910.

Abstract

We report a systematic multielement study of impurities in CdS window layers by dynamic and quantitative secondary-ion-mass spectrometry (SIMS) with high depth resolution. The study was carried out on CdTe/CdS solar cell structures, with the glass substrate removed. The analysis proceeded from the transparent conductive oxide free surface to the CdTe absorbing layer with a view to examining the influence of the CdCl2 heat treatment on the distribution and concentration of impurities in the structures. Special attention was paid to the impurities present in the CdS window layer that may be electrically active, and therefore affect the characteristics of the CdTe/CdS device. It was shown that Cl, Na, and Sb impurities had higher concentrations in CdS following cadmium chloride (CdCl2) heat treatment while Pb, O, Sn, and Cu conserved the same concentration. Furthermore, Zn, Si, and In showed slightly lower concentrations on CdCl2 treatment. Possible explanations of these changes are discussed and the results compared with previous SIMS measurements from the "back wall" (i.e., from the CdTe free surface through the glass substrate) obtained from the same structures

Item Type:Article
Keywords:CDS, Spectroscopy, Activation.
Full text:PDF - Published Version (100Kb)
Status:Peer-reviewed
Publisher Web site:http://dx.doi.org/10.1063/1.1921344
Publisher statement:Copyright (2005) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Emziane, M. and Durose, K. and Halliday, D. P. and Romeo, N. and Bosio, A. (2005) 'The distribution of impurities in the interfaces and window layers of thin-film solar cells.', Journal of applied physics., 97 (11). p. 114910. and may be found at http://dx.doi.org/10.1063/1.1921344
Record Created:13 Dec 2006
Last Modified:26 Apr 2011 14:57

Social bookmarking: del.icio.usConnoteaBibSonomyCiteULikeFacebookTwitterExport: EndNote, Zotero | BibTex
Usage statisticsLook up in GoogleScholar | Find in a UK Library