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Young’s fringes from vertically integrated slab waveguides: Applications to humidity sensing

Cross, G.H.; Ren, Y.T.; Freeman, N.J.

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Authors

G.H. Cross

Y.T. Ren

N.J. Freeman



Abstract

Using a multiple layer optical waveguide system consisting of two vertically slab waveguides, classical Young’s fringes may be obtained in the far-field diffraction plane. In agreement with the simple theory of diffraction interference the spacing of the far-field fringes is easily observed on mm to cm dimensions without further transformation of the output light. The simple methods of fabrication and means of optical coupling should provide a readily adaptable method for examining the principles of interferometry in an integrated optical format. The structure acts to transform polarized incident plane wave input light into separate slab modes of the device which emerge as two closely spaced and coherent sources at the output. The elements required for a classical Young’s fringe demonstration are therefore all embodied in this approach. The basic concept can be applied to an optical method for sensing. In one example of this we demonstrate measurement of the phase difference induced between the upper and lower propagating modes in structures due to water vapor diffusion into the layers which are formed from hydrophilic polymers. The Young’s fringe patterns exhibit a spatial intensity distribution which is sensitive to water vapor introduced over the surface of the structure. Differences in the effective index between the modes of the two waveguides during the diffusion of the vapor causes phase shifts which result in redistribution in the fringe pattern. The anticipated limit of detection of these devices is lower than 1 ppm for water vapor.

Citation

Cross, G., Ren, Y., & Freeman, N. (1999). Young’s fringes from vertically integrated slab waveguides: Applications to humidity sensing. Journal of Applied Physics, 86(11), 6483-6488. https://doi.org/10.1063/1.371712

Journal Article Type Article
Acceptance Date Aug 26, 1999
Publication Date Dec 1, 1999
Deposit Date Aug 18, 2015
Publicly Available Date Aug 19, 2015
Journal Journal of Applied Physics
Print ISSN 0021-8979
Electronic ISSN 1089-7550
Publisher American Institute of Physics
Peer Reviewed Peer Reviewed
Volume 86
Issue 11
Pages 6483-6488
DOI https://doi.org/10.1063/1.371712

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Copyright Statement
© 1999 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 86, 6483 (1999) and may be found at http://dx.doi.org/10.1063/1.371712





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