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Diode laser wavelength tracking using an integrated dual slab waveguide interferometer.

Cross, G. H. and Strachan, E. E. (2002) 'Diode laser wavelength tracking using an integrated dual slab waveguide interferometer.', IEEE photonics technology letters., 14 (7). pp. 950-952.

Abstract

The problem of tracking small changes in the output wavelength of laser diodes is addressed using a dual slab waveguide interferometer fabricated from silicon oxynitride. Waveguide mode dispersion differences between the waveguide modes provide a mechanism for identifying input wavelength shifts that are measured as shifts in the output far-field diffraction image. At visible wavelengths the device can transduce input wavelength changes into phase responses with a sensitivity of +0.9 rad/nm. The lower threshold limit of detection for laser output frequency shifts, is 2.2 GHz or 6 pm at a center wavelength of 635 run. The TE and TM sensitivities to wavelength are approximately equivalent in the device described.

Item Type:Article
Additional Information:This idea came out of previous work on the interferometer I devised and published on in 1999. The co-author is a project student undergraduate who undertook the experimental work.
Keywords:Dispersion, Interferometer, Optical waveguides, Wavelength lockers.
Full text:PDF - Published Version (163Kb)
Status:Peer-reviewed
Publisher Web site:http://dx.doi.org/10.1109/LPT.2002.1012395
Publisher statement:© 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Record Created:28 May 2008
Last Modified:09 Aug 2011 11:59

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