Diode laser wavelength tracking using an integrated dual slab waveguide interferometer

Cross, G.H.; Strachan, E.E.

doi:10.1109/lpt.2002.1012395

Diode laser wavelength tracking using an integrated dual slab waveguide interferometer

Cross, G.H.; Strachan, E.E.

Authors

G.H. Cross

E.E. Strachan

Abstract

The problem of tracking small changes in the output wavelength of laser diodes is addressed using a dual slab waveguide interferometer fabricated from silicon oxynitride. Waveguide mode dispersion differences between the waveguide modes provide a mechanism for identifying input wavelength shifts that are measured as shifts in the output far-field diffraction image. At visible wavelengths the device can transduce input wavelength changes into phase responses with a sensitivity of +0.9 rad/nm. The lower threshold limit of detection for laser output frequency shifts, is 2.2 GHz or 6 pm at a center wavelength of 635 run. The TE and TM sensitivities to wavelength are approximately equivalent in the device described.

Citation

Cross, G., & Strachan, E. (2002). Diode laser wavelength tracking using an integrated dual slab waveguide interferometer. IEEE Photonics Technology Letters, 14(7), 950-952. https://doi.org/10.1109/lpt.2002.1012395

Journal Article Type	Article
Publication Date	2002-07
Deposit Date	May 28, 2008
Publicly Available Date	May 28, 2008
Journal	IEEE Photonics Technology Letters
Print ISSN	1041-1135
Publisher	Institute of Electrical and Electronics Engineers
Peer Reviewed	Peer Reviewed
Volume	14
Issue	7
Pages	950-952
DOI	https://doi.org/10.1109/lpt.2002.1012395
Keywords	Dispersion, Interferometer, Optical waveguides, Wavelength lockers.

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