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Analysis of electron multiplying charge coupled device and scientific CMOS readout noise models for Shack–Hartmann wavefront sensor accuracy

Basden, A.G.

Analysis of electron multiplying charge coupled device and scientific CMOS readout noise models for Shack–Hartmann wavefront sensor accuracy Thumbnail


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Abstract

In recent years, detectors with subelectron readout noise have been used very effectively in astronomical adaptive optics systems. Here, we compare readout noise models for the two key faint flux level detector technologies that are commonly used: electron multiplying charge coupled device (EMCCD) and scientific CMOS (sCMOS) detectors. We find that in almost all situations, EMCCD technology is advantageous, and that the commonly used simplified model for EMCCD readout is appropriate. We also find that the commonly used simple models for sCMOS readout noise are optimistic, and we recommend that a proper treatment of the sCMOS root mean square readout noise probability distribution should be considered during instrument performance modeling and development.

Citation

Basden, A. (2015). Analysis of electron multiplying charge coupled device and scientific CMOS readout noise models for Shack–Hartmann wavefront sensor accuracy. Journal of Astronomical Telescopes, Instruments, and Systems, 1(3), Article 039002. https://doi.org/10.1117/1.jatis.1.3.039002

Journal Article Type Article
Acceptance Date Jun 25, 2015
Online Publication Date Jul 27, 2015
Publication Date Jul 27, 2015
Deposit Date Jun 26, 2015
Publicly Available Date Mar 29, 2024
Journal Journal of Astronomical Telescopes, Instruments, and Systems
Electronic ISSN 2329-4221
Publisher Society of Photo-optical Instrumentation Engineers
Peer Reviewed Peer Reviewed
Volume 1
Issue 3
Article Number 039002
DOI https://doi.org/10.1117/1.jatis.1.3.039002

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Publisher Licence URL
http://creativecommons.org/licenses/by/4.0/

Copyright Statement
© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.





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