Mr Jonathan Mark Hammler jonathan.hammler@durham.ac.uk
PGR Student Doctor of Philosophy
3D polymer structures with variable permittivity at terahertz frequencies
Hammler, J.; Pan, Y.; Gallant, A.J.; Balocco, C.
Authors
Y. Pan
Professor Andrew Gallant a.j.gallant@durham.ac.uk
Professor
Professor Claudio Balocco claudio.balocco@durham.ac.uk
Professor
Abstract
Titanium dioxide (TiO2) powder has been blended with polydimethylsiloxane (PDMS) to manufacture a composite polymer with variable permittivity. Vector network analyser measurements taken between 0.75-1.1 THz quantify the relationship between TiO2 concentration and complex permittivity of the resultant material. Complex 3D structures have been produced with a casting process. Applications for the tunable-permittivity polymer include dielectric regions in photonic and plasmonic devices operating at terahertz frequencies as well as single pixel imaging systems.
Citation
Hammler, J., Pan, Y., Gallant, A., & Balocco, C. (2015). 3D polymer structures with variable permittivity at terahertz frequencies. In 40th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 23-28 August 2015, Hong Kong (1-2). https://doi.org/10.1109/irmmw-thz.2015.7327458
Conference Name | 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) |
---|---|
Conference Location | Hong Kong, China |
Start Date | Aug 23, 2015 |
End Date | Aug 28, 2015 |
Acceptance Date | Aug 23, 2015 |
Publication Date | Aug 23, 2015 |
Deposit Date | Dec 7, 2015 |
Publicly Available Date | Jan 26, 2016 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1-2 |
Series Title | IEEE Conference Proceedings |
Book Title | 40th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 23-28 August 2015, Hong Kong. |
DOI | https://doi.org/10.1109/irmmw-thz.2015.7327458 |
Keywords | Curing, Dielectrics, Imaging, Permittivity, Polymers, Powders, Three-dimensional displays. |
Additional Information | Date of Conference: 23-28 August 2015 |
Files
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© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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