Dr Mahmoud Shahbazi mahmoud.shahbazi@durham.ac.uk
Associate Professor
Open- and Short-Circuit Switch Fault Diagnosis for Nonisolated DC–DC Converters Using Field Programmable Gate Array
Shahbazi, M.; Jamshidpour, E.; Poure, P.; Saadate, S.; Zolghadri, M.R.
Authors
E. Jamshidpour
P. Poure
S. Saadate
M.R. Zolghadri
Abstract
Fault detection (FD) in power electronic converters is necessary in embedded and safety critical applications to prevent further damage. Fast FD is a mandatory step in order to make a suitable response to a fault in one of the semiconductor devices. The aim of this study is to present a fast yet robust method for fault diagnosis in nonisolated dc-dc converters. FD is based on time and current criteria which observe the slope of the inductor current over the time. It is realized by using a hybrid structure via coordinated operation of two FD subsystems that work in parallel. No additional sensors, which increase system cost and reduce reliability, are required for this detection method. For validation, computer simulations are first carried out. The proposed detection scheme is validated on a boost converter. Effects of input disturbances and the closed-loop control are also considered. In the experimental setup, a field programmable gate array digital target is used for the implementation of the proposed method, to perform a very fast switch FD. Results show that, with the presented method, FD is robust and can be done in a few microseconds.
Citation
Shahbazi, M., Jamshidpour, E., Poure, P., Saadate, S., & Zolghadri, M. (2013). Open- and Short-Circuit Switch Fault Diagnosis for Nonisolated DC–DC Converters Using Field Programmable Gate Array. IEEE Transactions on Industrial Electronics, 60(9), 4136-4146. https://doi.org/10.1109/tie.2012.2224078
Journal Article Type | Article |
---|---|
Publication Date | Sep 1, 2013 |
Deposit Date | Jan 29, 2016 |
Publicly Available Date | Apr 26, 2016 |
Journal | IEEE Transactions on Industrial Electronics |
Print ISSN | 0278-0046 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 60 |
Issue | 9 |
Pages | 4136-4146 |
DOI | https://doi.org/10.1109/tie.2012.2224078 |
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© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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