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Identification of degradation mechanisms in field-tested CdTe modules.

Carlsson, T. and Brinkman, A. W. (2006) 'Identification of degradation mechanisms in field-tested CdTe modules.', Progress in photovoltaics : research and applications, 14 (3). pp. 213-224.

Abstract

Field tests and accelerated ageing tests were conducted on CdTe photovoltaic modules with Sb-based back contacts. Significant performance degradation was observed during one and a half years of outdoor exposure. Small-area samples were prepared from field tested modules and characterized with current-voltage, capacitance-voltage and resistance measurements. Results show that module performance degradation in the field can be partly attributed to a decrease in doping concentration close to the CdS/CdTe junction and an increased resistance in the transparent front contact. A comparison with results in the literature indicates that bias voltage may play a role in the degradation process.

Item Type:Article
Keywords:Photovoltaics, CdTe, Field test, Accelerated ageing, Degradation.
Full text:Full text not available from this repository.
Publisher Web site:http://dx.doi.org/10.1002/pip.663
Record Created:14 Feb 2007
Last Modified:08 Apr 2009 16:27

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