Modifications to the synthetic aperture microwave imaging diagnostic

Brunner, K.J.; Chorley, J.C.; Dipper, N.A.; Naylor, G.; Sharples, R.M.; Taylor, G.; Thomas, D.A.; Vann, R.G.L.

doi:10.1063/1.4961283

Modifications to the synthetic aperture microwave imaging diagnostic

Brunner, K.J.; Chorley, J.C.; Dipper, N.A.; Naylor, G.; Sharples, R.M.; Taylor, G.; Thomas, D.A.; Vann, R.G.L.

Authors

K.J. Brunner

J.C. Chorley

N.A. Dipper

G. Naylor

Professor Ray Sharples r.m.sharples@durham.ac.uk
Professor

G. Taylor

D.A. Thomas

R.G.L. Vann

Abstract

The synthetic aperture microwave imaging diagnostic has been operating on the MAST experiment since 2011. It has provided the first 2D images of B-X-O mode conversion windows and showed the feasibility of conducting 2D Doppler back-scattering experiments. The diagnostic heavily relies on field programmable gate arrays to conduct its work. Recent successes and newly gained experience with the diagnostic have led us to modify it. The enhancements will enable pitch angle profile measurements, O and X mode separation, and the continuous acquisition of 2D DBS data. The diagnostic has also been installed on the NSTX-U and is acquiring data since May 2016.

Citation

Brunner, K., Chorley, J., Dipper, N., Naylor, G., Sharples, R., Taylor, G., …Vann, R. (2016). Modifications to the synthetic aperture microwave imaging diagnostic. Review of Scientific Instruments, 87(11), Article 11E129. https://doi.org/10.1063/1.4961283

Journal Article Type	Article
Acceptance Date	Aug 2, 2016
Online Publication Date	Nov 14, 2016
Publication Date	Sep 2, 2016
Deposit Date	Oct 5, 2016
Publicly Available Date	Mar 8, 2017
Journal	Review of Scientific Instruments
Print ISSN	0034-6748
Publisher	American Institute of Physics
Peer Reviewed	Peer Reviewed
Volume	87
Issue	11
Article Number	11E129
DOI	https://doi.org/10.1063/1.4961283

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Copyright Statement
© 2016 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Brunner, K.J. and Chorley, J.C. and Dipper, N.A. and Naylor, G. and Sharples, R.M. and Taylor, G. and Thomas, D.A. and Vann, R.G.L. (2016) 'Modifications to the synthetic aperture microwave imaging diagnostic.', Review of scientific instruments., 87 (11). 11E129 and may be found at https://doi.org/10.1063/1.4961283