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Temperature Dependence of Magnetically Dead Layers in Ferromagnetic Thin-Films

Tokac, M.; Kinane, C.J.; Atkinson, D.; Hindmarch, A.T.

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Authors

M. Tokac

C.J. Kinane



Abstract

Polarized neutron reflectometry has been used to study interface magnetism and magnetic dead layers in model amorphous CoFeB:Ta alloy thin-film multilayers with Curie temperatures tuned to be below room-temperature. This allows temperature dependent variations in the effective magnetic thickness of the film to be determined at temperatures that are a significant fraction of the Curie temperature, which cannot be achieved in the material systems used for spintronic devices. In addition to variation in the effective magnetic thickness due to compositional grading at the interface with the tantalum capping layer, the key finding is that at the interface between ferromagnetic film and GaAs(001) substrate local interfacial alloying creates an additional magnetic dead-layer. The thickness of this magnetic dead-layer is temperature dependent, which may have significant implications for elevated-temperature operation of hybrid ferromagnetic metal-semiconductor spintronic devices.

Citation

Tokac, M., Kinane, C., Atkinson, D., & Hindmarch, A. (2017). Temperature Dependence of Magnetically Dead Layers in Ferromagnetic Thin-Films. AIP Advances, 7(11), Article 115022. https://doi.org/10.1063/1.4997366

Journal Article Type Article
Acceptance Date Nov 15, 2017
Online Publication Date Nov 27, 2017
Publication Date Nov 27, 2017
Deposit Date Jul 20, 2017
Publicly Available Date Nov 28, 2017
Journal AIP Advances
Publisher American Institute of Physics
Peer Reviewed Peer Reviewed
Volume 7
Issue 11
Article Number 115022
DOI https://doi.org/10.1063/1.4997366

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