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Self-field Effects on JC(B,T) Measurements of Nb-Ti Strands in High Magnetic Fields

Ridgeon, F.J.; Raine, M.J.; Lakrimi, M.; Thomas, A.; Boutboul, T.; Hampshire, D.P.

Self-field Effects on JC(B,T) Measurements of Nb-Ti Strands in High Magnetic Fields Thumbnail


Authors

F.J. Ridgeon

M. Lakrimi

A. Thomas

T. Boutboul

D.P. Hampshire



Contributors

Abstract

We have investigated the applied magnetic field, temperature, and self-field dependence of the critical current density of a Nb-Ti strand produced for the ITER Poloidal Field conductor. Measurements were made on a standard ITER barrel in magnetic fields from 4.0 to 8.0 T and temperatures from 3.5 to 6.0 K. We investigated the effect of self-field by changing the direction of the transport current, resulting in an inward or outward Lorentz force acting on the strand. At 4.2 K and 5 T, the difference in the measured JC between the two Lorentz force polarities was about 1%. From this low value, we conclude that self-field effects in the Nb-Ti strand are about 40 % of those expected using standard self-field calculations for fully transposed multifilamentary strands, consistent with theoretical considerations for annular filament transposition.

Citation

Ridgeon, F., Raine, M., Lakrimi, M., Thomas, A., Boutboul, T., & Hampshire, D. (2018). Self-field Effects on JC(B,T) Measurements of Nb-Ti Strands in High Magnetic Fields. IEEE Transactions on Applied Superconductivity, 28(4), Article 9001805. https://doi.org/10.1109/tasc.2018.2808370

Journal Article Type Article
Acceptance Date Feb 7, 2018
Online Publication Date Feb 21, 2018
Publication Date Jun 1, 2018
Deposit Date Feb 8, 2018
Publicly Available Date Mar 29, 2024
Journal IEEE Transactions on Applied Superconductivity
Print ISSN 1051-8223
Electronic ISSN 1558-2515
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 28
Issue 4
Article Number 9001805
DOI https://doi.org/10.1109/tasc.2018.2808370
Related Public URLs http://ieeexplore.ieee.org/document/8298512/

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Revised version © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.





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