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Interfacial TADF Exciplex as a Tool to Localise Excitons, Improve Efficiency and Increase OLED Lifetime

Colella, Marco; Pander, Piotr Henryk; Pereira, Daniel De Sa; Monkman, Andrew P.

Interfacial TADF Exciplex as a Tool to Localise Excitons, Improve Efficiency and Increase OLED Lifetime Thumbnail


Authors

Marco Colella

Daniel De Sa Pereira



Abstract

In this work, we employ a TADF exciplex formed between the emissive layer (EML) host, 26DCzPPy, and the electron transport layer (ETL), PO-T2T at the interface between the EML and the ETL to improve the stability and efficiency of a phosphorescence OLED based on Ir(dmpq)2acac. We show that the presence of the TADF exciplex at the EML-ETL interface induces an efficient localisation of the recombination zone which is confined within the 5 nm thick EML. Furthermore, the TADF exciplex allows harvesting of the holes and electrons that piled-up at the EML-ETL interface and transfer the resultant excited state energy to the phosphorescent emitter through Förster and/or Dexter energy transfer. This approach effectively improves the LT90 of devices from <1 min to 6 h by limiting recombination processes outside of the 5 nm EML.

Citation

Colella, M., Pander, P. H., Pereira, D. D. S., & Monkman, A. P. (2018). Interfacial TADF Exciplex as a Tool to Localise Excitons, Improve Efficiency and Increase OLED Lifetime. ACS Applied Materials and Interfaces, 10(46), 40001-40007. https://doi.org/10.1021/acsami.8b15942

Journal Article Type Article
Acceptance Date Nov 1, 2018
Online Publication Date Nov 1, 2018
Publication Date Nov 1, 2018
Deposit Date Nov 6, 2018
Publicly Available Date Nov 1, 2019
Journal ACS Applied Materials and Interfaces
Print ISSN 1944-8244
Electronic ISSN 1944-8252
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 10
Issue 46
Pages 40001-40007
DOI https://doi.org/10.1021/acsami.8b15942

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Accepted Journal Article (742 Kb)
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Copyright Statement
This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS applied materials & interfaces copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acsami.8b15942





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