Electron Compton scattering and the measurement of electron momentum distributions in solids

Talmantaite, A.; Hunt, M.R.C.; Mendis, B.G.

doi:10.1111/jmi.12854

Electron Compton scattering and the measurement of electron momentum distributions in solids

Talmantaite, A.; Hunt, M.R.C.; Mendis, B.G.

Authors

A. Talmantaite

Dr Michael Hunt m.r.c.hunt@durham.ac.uk
Associate Professor

Dr Buddhika Mendis b.g.mendis@durham.ac.uk
Associate Professor

Abstract

Electron Compton scattering is a technique that gives information on the electron momentum density of states and is used to characterize the ground state electronic structure in solids. Extracting the momentum density of states requires us to assume the so‐called ‘impulse approximation’, which is valid for large energy losses. Here, the robustness of the impulse approximation in the low energy transfer regime is tested and confirmed on amorphous carbon films. Compared to traditional Compton measurements, this provides additional benefits of more efficient data collection and a simplified way to probe valence electrons, which govern solid state bonding. However, a potential complication is the increased background from the plasmon signal. To overcome this, a novel plasmon background subtraction routine is proposed for samples that are resistant to beam damage.

Citation

Talmantaite, A., Hunt, M., & Mendis, B. (2020). Electron Compton scattering and the measurement of electron momentum distributions in solids. Journal of Microscopy, 279(3), 185-188. https://doi.org/10.1111/jmi.12854

Journal Article Type	Article
Acceptance Date	Dec 7, 2019
Online Publication Date	Jan 6, 2020
Publication Date	2020-09
Deposit Date	Jan 10, 2020
Publicly Available Date	Jan 10, 2020
Journal	Journal of Microscopy
Print ISSN	0022-2720
Electronic ISSN	1365-2818
Publisher	Wiley
Peer Reviewed	Peer Reviewed
Volume	279
Issue	3
Pages	185-188
DOI	https://doi.org/10.1111/jmi.12854

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Advance online version © The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society.
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