Stinton, G. W. and Evans, J. S. O. (2007) 'Parametric Rietveld refinement.', Journal of applied crystallography., 40 (1). pp. 87-95.
In this paper the method of parametric Rietveld refinement is described, in which an ensemble of diffraction data collected as a function of time, temperature, pressure or any other variable are fitted to a single evolving structural model. Parametric refinement offers a number of potential benefits over independent or sequential analysis. It can lead to higher precision of refined parameters, offers the possibility of applying physically realistic models during data analysis, allows the refinement of `non-crystallographic' quantities such as temperature or rate constants directly from diffraction data, and can help avoid false minima.
|Keywords:||Powder diffraction, Non-ambient, Rietveld refinement.|
|Full text:||(VoR) Version of Record|
Download PDF (889Kb)
|Publisher Web site:||http://dx.doi.org/10.1107/S0021889806043275|
|Record Created:||11 May 2007|
|Last Modified:||19 May 2010 11:07|
|Social bookmarking:||Export: EndNote, Zotero | BibTex|
|Look up in GoogleScholar | Find in a UK Library|