Scattering in THz imaging

Fletcher, J.R.; Swift, G.P.; Dai, D.C.; Beggs, D.; Abram, R.A.; Kaliteevski, M.; Levitt, J.; Gallant, A.; Chamberlain*, J.M.

doi:10.1117/12.638007

Scattering in THz imaging

Fletcher, J.R.; Swift, G.P.; Dai, D.C.; Beggs, D.; Abram, R.A.; Kaliteevski, M.; Levitt, J.; Gallant, A.; Chamberlain*, J.M.

Authors

J.R. Fletcher

G.P. Swift

D.C. Dai

D. Beggs

R.A. Abram

M. Kaliteevski

J. Levitt

A. Gallant

J.M. Chamberlain*

Abstract

A new mathematical method, the Phase Distribution Model, is devised for the calculation of attenuation and scattering of THz radiation in random materials. The accuracy of the approximation is tested by comparison with exact calculations and with experimental measurements on textiles and specially constructed phantoms.

Citation

Fletcher, J., Swift, G., Dai, D., Beggs, D., Abram, R., Kaliteevski, M., …Chamberlain*, J. (2005). Scattering in THz imaging. In Technologies for optical countermeasures II; femtosecond phenomena II; and passive millimetre-wave and terahertz imaging II (320-325). https://doi.org/10.1117/12.638007

Conference Name	Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II.
Conference Location	Bruges, Belgium
Publication Date	Nov 1, 2005
Deposit Date	Sep 29, 2010
Publicly Available Date	Nov 15, 2010
Volume	5989
Pages	320-325
Series Title	Proceedings of SPIE
Series ISSN	0277-786X,1996-756X
Book Title	Technologies for optical countermeasures II; femtosecond phenomena II; and passive millimetre-wave and terahertz imaging II.
DOI	https://doi.org/10.1117/12.638007

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