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Using a Follow-on Survey to Investigate Why Use of the Visitor, Singleton and Facade Patterns is Controversial

Zhang, C.; Budgen, D.; Drummond, S.

Using a Follow-on Survey to Investigate Why Use of the Visitor, Singleton and Facade Patterns is Controversial Thumbnail


Authors

C. Zhang

D. Budgen

S. Drummond



Abstract

Context: A previous study has shown that software devel- opers who are experienced with using design patterns hold some con icting opinions about three of the more popular design patterns: Facade, Singleton and Visitor. Aim: To identify the characteristics of these three patterns that have caused them to generate such differing views. Method: We employed a qualitative follow-on survey of those developers who had taken part in the earlier survey about design patterns. Results: We received 46 usable responses from a possible total of 188, with nearly 85% of respondents having six or more years of experience with design patterns. Of these, 27 also provided comments and descriptions of experiences about the patterns, which we categorised. Conclusions: All three patterns can easily be misused and in each case, the consequences of misuse are regarded as being particularly significant.

Citation

Zhang, C., Budgen, D., & Drummond, S. (2012). Using a Follow-on Survey to Investigate Why Use of the Visitor, Singleton and Facade Patterns is Controversial. In 6th International Symposium on Empirical Software Engineering and Measurement (ESEM'12) : September 19-20, Lund, Sweden ; proceedings (79-88). https://doi.org/10.1145/2372251.2372264

Conference Name 6th International Symposium on Empirical Software Engineering & Measurement
Conference Location Lund, Sweden
Start Date Sep 19, 2012
End Date Sep 20, 2012
Online Publication Date Sep 19, 2012
Publication Date Sep 19, 2012
Deposit Date Jun 1, 2012
Publicly Available Date Feb 22, 2013
Pages 79-88
Book Title 6th International Symposium on Empirical Software Engineering and Measurement (ESEM'12) : September 19-20, Lund, Sweden ; proceedings.
DOI https://doi.org/10.1145/2372251.2372264
Keywords Design pattern, Survey, Empirical.
Additional Information Conference dates: 19-20 September 2012

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Copyright Statement
© ACM, 2012. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in ESEM '12 Proceedings of the ACM-IEEE international symposium on Empirical software engineering and measurement, 2012, http://dx.doi.org/10.1145/2372251.2372264





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