Nanomagnetic engineering of the properties of domain wall atom traps

Hayward, T.J.; West, A.D.; Weatherill, K.J.; Schrefl, T.; Hughes, I.G.; Allwood, D.A.

doi:10.1063/1.3671631

Nanomagnetic engineering of the properties of domain wall atom traps

Hayward, T.J.; West, A.D.; Weatherill, K.J.; Schrefl, T.; Hughes, I.G.; Allwood, D.A.

Authors

T.J. Hayward

A.D. West

Professor Kevin Weatherill k.j.weatherill@durham.ac.uk
Professor

T. Schrefl

Professor Ifan Hughes i.g.hughes@durham.ac.uk
Professor

D.A. Allwood

Abstract

We have used the results of micromagnetic simulations to investigate the effects of nanowire geometry and domain wall magnetization structure on the characteristic parameters of magnetic atom traps formed by domain walls in planar ferromagnetic nanowires. It is found that when traps are formed in the near-field of a domain wall both nanowire geometry and wall structure have a substantial effect on trap frequency (how tightly atoms are spatially confined) and adiabaticity (how closely the atoms’ magnetic moments track the applied field direction within the trap). We also show that in certain regimes a trap’s depth depends only on the amplitude of an externally applied rotating magnetic field, thus allowing it to be tuned independently of the trap’s other critical parameters.

Citation

Hayward, T., West, A., Weatherill, K., Schrefl, T., Hughes, I., & Allwood, D. (2011). Nanomagnetic engineering of the properties of domain wall atom traps. Journal of Applied Physics, 110(12), Article 123918. https://doi.org/10.1063/1.3671631

Journal Article Type	Article
Publication Date	Dec 1, 2011
Deposit Date	Jan 26, 2012
Publicly Available Date	Sep 26, 2012
Journal	Journal of Applied Physics
Print ISSN	0021-8979
Electronic ISSN	1089-7550
Publisher	American Institute of Physics
Peer Reviewed	Peer Reviewed
Volume	110
Issue	12
Article Number	123918
DOI	https://doi.org/10.1063/1.3671631

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Copyright Statement
© 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Hayward, T. J. and West, A. D. and Weatherill, K. J. and Schrefl, T. and Hughes, I. G. and Allwood, D. A. (2011) 'Nanomagnetic engineering of the properties of domain wall atom traps.', Journal of applied physics., 110 (12). p. 123918and may be found at http://dx.doi.org/10.1063/1.3671631