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Focused-ion-beam induced interfacial intermixing of magnetic bilayers for nanoscale control of magnetic properties.

Burn, D.M. and Hase, T.P.A. and Atkinson, D. (2014) 'Focused-ion-beam induced interfacial intermixing of magnetic bilayers for nanoscale control of magnetic properties.', Journal of physics : condensed matter., 26 (23). p. 236002.


Modification of the magnetic properties in a thin-film ferromagnetic/non-magnetic bilayer system by low-dose focused ion-beam (FIB) induced intermixing is demonstrated. The highly localized capability of FIB may be used to locally control magnetic behaviour at the nanoscale. The magnetic, electronic and structural properties of NiFe/Au bilayers were investigated as a function of the interfacial structure that was actively modified using focused Ga+ ion irradiation. Experimental work used MOKE, SQUID, XMCD as well as magnetoresistance measurements to determine the magnetic behavior and grazing incidence x-ray reflectivity to elucidate the interfacial structure. Interfacial intermixing, induced by low-dose irradiation, is shown to lead to complex changes in the magnetic behavior that are associated with monotonic structural evolution of the interface. This behavior may be explained by changes in the local atomic environment within the interface region resulting in a combination of processes including the loss of moment on Ni and Fe, an induced moment on Au and modifications to the spin-orbit coupling between Au and NiFe.

Item Type:Article
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Publisher statement:Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Date accepted:14 April 2014
Date deposited:18 June 2014
Date of first online publication:16 May 2014
Date first made open access:No date available

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