High-resolution AFM in liquid: what about the tip?

Voïtchovsky, K.

doi:10.1088/0957-4484/26/10/100501

High-resolution AFM in liquid: what about the tip?

Voïtchovsky, K.

Authors

Professor Kislon Voitchovsky kislon.voitchovsky@durham.ac.uk
Professor

Abstract

Atomic Force Microscopy relies on a nanoscale tip to image and probe samples, often down to the sub-nanometre level. The measurement process depends on the precise geometry and chemical nature of the tip apex, and is therefore difficult to control. In the current issue of Nanotechnology, Akrami and co-workers show that, for measurements in aqueous solutions and on flat samples, the presence of stable hydration sites at the tip apex is key to achieving high-resolution images. These sites can be created on commercial tips using a simple preparation strategy that prevents build-up of interfering contaminants. The findings by Akrami et al also suggest a possible way forward to control the influence of the tip on high-resolution measurements.

Citation

Voïtchovsky, K. (2015). High-resolution AFM in liquid: what about the tip?. Nanotechnology, 26(10), Article 100501. https://doi.org/10.1088/0957-4484/26/10/100501

Journal Article Type	Article
Acceptance Date	Feb 10, 2015
Publication Date	Mar 13, 2015
Deposit Date	Apr 20, 2015
Publicly Available Date	Apr 27, 2015
Journal	Nanotechnology
Print ISSN	0957-4484
Electronic ISSN	1361-6528
Publisher	IOP Publishing
Peer Reviewed	Peer Reviewed
Volume	26
Issue	10
Article Number	100501
DOI	https://doi.org/10.1088/0957-4484/26/10/100501

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Copyright Statement
This is an author-created, un-copyedited version of an article published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://dx.doi.org/10.1088/0957-4484/26/10/100501.