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Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics

Mendis, B.G.; Gachet, D.; Major, J.D.; Durose, K.

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Authors

D. Gachet

J.D. Major

K. Durose



Abstract

A novel time-resolved cathodoluminescence method, where a pulsed electron beam is generated via the photoelectric effect, is used to probe individual CdTe grain boundaries. Excitons have a short lifetime (≤100  ps ) within the grains and are rapidly quenched at the grain boundary. However, a ∼47  meV shallow acceptor, believed to be due to oxygen, can act as a long lifetime hole trap, even at the grain boundaries where their concentration is higher. This provides direct evidence supporting recent observations of hopping conduction across grain boundaries in highly doped CdTe at low temperature.

Citation

Mendis, B., Gachet, D., Major, J., & Durose, K. (2015). Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics. Physical Review Letters, 115(21), Article 218701. https://doi.org/10.1103/physrevlett.115.218701

Journal Article Type Article
Acceptance Date Jun 25, 2015
Online Publication Date Nov 18, 2015
Publication Date Nov 18, 2015
Deposit Date Nov 24, 2015
Publicly Available Date Nov 26, 2015
Journal Physical Review Letters
Print ISSN 0031-9007
Electronic ISSN 1079-7114
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 115
Issue 21
Article Number 218701
DOI https://doi.org/10.1103/physrevlett.115.218701

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Copyright Statement
Reprinted with permission from the American Physical Society: Mendis, B.G., Gachet, D., Major, J.D. and Durose, K. (2015) 'Long lifetime hole traps at grain boundaries in CdTe thin-film photovoltaics.', Physical review letters., 115(21): 218701 © 2015 by the American Physical Society. Readers may view, browse, and/or download material for temporary copying purposes only, provided these uses are for noncommercial personal purposes. Except as provided by law, this material may not be further reproduced, distributed, transmitted, modified, adapted, performed, displayed, published, or sold in whole or part, without prior written permission from the American Physical Society.






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