T. Carney
Modelling Electronic Circuit Failures using a Xilinx FPGA System
Carney, T.; McWilliam, R.; Purvis, A.
Abstract
FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across many industries. Almost all modern FPGAs employ SRAM based configuration memory elements which are susceptible to radiation induced soft errors. In high altitude and space applications, as well as in the nuclear and defence industries, such circuits must operate reliably in radiation-rich environments. A range of soft error mitigation techniques have been proposed but testing and qualification of new fault tolerant circuits can be an expensive and time consuming process. A novel method for simulating radiation-induced soft errors is presented that operates entirely within a laboratory environment and requires no hazardous exposure to radiation or expensive airborne test rigs. A system utilising modular redundancy is then implemented and tested under the new method. The test system is further demonstrated in conjunction with a software flight simulator to test single electronic modules in the context of active service on board a passenger aircraft and the effects of failure under radiation induced soft errors are observed. Our research proposes a test regime in which design strategies for self-healing circuits can be compared and demonstrated to work.
Citation
Carney, T., McWilliam, R., & Purvis, A. (2015). Modelling Electronic Circuit Failures using a Xilinx FPGA System. Procedia CIRP, 38, 277-282. https://doi.org/10.1016/j.procir.2015.08.039
Journal Article Type | Article |
---|---|
Acceptance Date | Aug 13, 2015 |
Publication Date | Oct 27, 2015 |
Deposit Date | Dec 11, 2015 |
Publicly Available Date | Dec 11, 2015 |
Journal | Procedia CIRP |
Print ISSN | 2212-8271 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 38 |
Pages | 277-282 |
DOI | https://doi.org/10.1016/j.procir.2015.08.039 |
Keywords | FPGA, Hardware-in-loop, Fault tolerance, TMR, Fault injection. |
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Copyright Statement
© 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
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