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Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness

Whittaker, K.A.; Keaveney, J.; Hughes, I.G.; Sargsyan, A.; Sarkisyan, D.; Adams, C.S.

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Authors

K.A. Whittaker

J. Keaveney

A. Sargsyan

D. Sarkisyan

C.S. Adams



Abstract

We measure the resonance line shape of atomic-vapor layers with nanoscale thickness confined between two sapphire windows. The measurement is performed by scanning a probe laser through resonance and collecting the scattered light. The line shape is dominated by the effects of Dicke narrowing, self-broadening, and atom-surface interactions. By fitting the measured line shape to a simple model we discuss the possibility to extract information about the atom-surface interaction.

Citation

Whittaker, K., Keaveney, J., Hughes, I., Sargsyan, A., Sarkisyan, D., & Adams, C. (2015). Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness. Physical Review A, 92(5), Article 052706. https://doi.org/10.1103/physreva.92.052706

Journal Article Type Article
Publication Date Nov 9, 2015
Deposit Date Jan 11, 2016
Publicly Available Date Jan 25, 2016
Journal Physical Review A
Print ISSN 1050-2947
Electronic ISSN 1094-1622
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 92
Issue 5
Article Number 052706
DOI https://doi.org/10.1103/physreva.92.052706

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Publisher Licence URL
http://creativecommons.org/licenses/by/4.0/

Copyright Statement
Published by the American Physical Society under the terms of the
Creative Commons Attribution 3.0 License. Further distribution of
this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.





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