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Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness.

Whittaker, K. A. and Keaveney, J. and Hughes, I. G. and Sargsyan, A. and Sarkisyan, D. and Adams, C. S. (2015) 'Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness.', Physical review A., 92 (5). 052706.

Abstract

We measure the resonance line shape of atomic-vapor layers with nanoscale thickness confined between two sapphire windows. The measurement is performed by scanning a probe laser through resonance and collecting the scattered light. The line shape is dominated by the effects of Dicke narrowing, self-broadening, and atom-surface interactions. By fitting the measured line shape to a simple model we discuss the possibility to extract information about the atom-surface interaction.

Item Type:Article
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Status:Peer-reviewed
Publisher Web site:http://dx.doi.org/10.1103/PhysRevA.92.052706
Publisher statement:Published by the American Physical Society under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
Date accepted:No date available
Date deposited:25 January 2016
Date of first online publication:November 2015
Date first made open access:No date available

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