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Channel characterization in high-speed railway station environments at 1.89 GHz

Zhou, Tao; Tao, Cheng; Salous, Sana; Liu, Liu; Tan, Zhenhui

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Authors

Tao Zhou

Cheng Tao

Liu Liu

Zhenhui Tan



Abstract

Channel characterization is the prerequisite condition for the research and development of the next-generation high-speed railway (HSR) communication system. Train station is one of typical HSR scenarios, where channel characteristics have not yet been investigated sufficiently. In this paper, wideband multiantenna channel measurements are performed at 1.89 GHz in an open-type train station environment based on long-term evolution networks along Beijing to Tianjin HSR in China. Large-scale characteristics of the HSR station channel, focusing on path loss, shadow fading (SF), and the autocorrelation property of SF, are studied. Moreover, small-scale characteristics, such as Ricean K-factor, delay spread, and spatial correlation, are analyzed and modeled. In addition, the stationary region is characterized using the RUN test method. The obtained results provide useful information for deployment and assessment of the future HSR communication system in the HSR station scenario.

Citation

Zhou, T., Tao, C., Salous, S., Liu, L., & Tan, Z. (2015). Channel characterization in high-speed railway station environments at 1.89 GHz. Radio Science, 50(11), 1176-1186. https://doi.org/10.1002/2015rs005793

Journal Article Type Article
Acceptance Date Oct 27, 2015
Online Publication Date Oct 30, 2015
Publication Date Nov 24, 2015
Deposit Date Feb 11, 2016
Publicly Available Date May 24, 2016
Journal Radio Science
Print ISSN 0048-6604
Electronic ISSN 1944-799X
Publisher Wiley
Peer Reviewed Peer Reviewed
Volume 50
Issue 11
Pages 1176-1186
DOI https://doi.org/10.1002/2015rs005793

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Copyright Statement
Zhou, T., C. Tao, S. Salous, L. Liu, and Z. Tan (2015), Channel characterization in high-speed railway station environments at 1.89 GHz, Radio Science, 50(11), 1176–1186, 10.1002/2015RS005793 (DOI). To view the published open abstract, go to http://dx.doi.org and enter the DOI.





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