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Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi.

Lancaster, T. and Xiao, F. and Salman, Z. and Thomas, I.O. and Blundell, S.J. and Pratt, F.L. and Clark, S.J. and Prokscha, T. and Suter, A. and Zhang, S.L. and Baker, A.A. and Hesjedal, T. (2016) 'Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi.', Physical review B., 93 (14). 140412(R).

Abstract

We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40-nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around and 30 K. Our results suggest that the cone phase is not the only magnetic texture realized in film samples for out-of-plane fields.

Item Type:Article
Full text:(AM) Accepted Manuscript
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Status:Peer-reviewed
Publisher Web site:http://dx.doi.org/10.1103/PhysRevB.93.140412
Publisher statement:Reprinted with permission from the American Physical Society: Physical Review B 93, 140412(R) © 2016 by the American Physical Society. Readers may view, browse, and/or download material for temporary copying purposes only, provided these uses are for noncommercial personal purposes. Except as provided by law, this material may not be further reproduced, distributed, transmitted, modified, adapted, performed, displayed, published, or sold in whole or part, without prior written permission from the American Physical Society.
Date accepted:06 April 2016
Date deposited:26 April 2016
Date of first online publication:25 April 2016
Date first made open access:No date available

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