Mr Jonathan Mark Hammler jonathan.hammler@durham.ac.uk
PGR Student Doctor of Philosophy
Free-Space Permittivity Measurement at Terahertz Frequencies with a Vector Network Analyser
Hammler, Jonathan; Gallant, Andrew J.; Balocco, Claudio
Authors
Professor Andrew Gallant a.j.gallant@durham.ac.uk
Professor
Professor Claudio Balocco claudio.balocco@durham.ac.uk
Professor
Abstract
A simple system, based on a vector network analyzer, has been used with new numerical de-embedding and parameter inversion techniques to determine the relative permittivity (dielectric properties) of materials within the frequency range 750–1100 GHz. Free-space (noncontact), nondestructive testing has been performed on various planar dielectric and semiconducting samples. This system topology is well suited for quality control testing in an industrial setting requiring high throughput. Scattering parameters, measured in the absence of a sample, were used to computationally move the measurement plane to the surface of the samples being characterized. This de-embedding process can be completed much faster than a traditional calibration process and does not require exact knowledge of system geometric lengths. An iterative method was developed for simultaneously determining both sample geometric thickness and electric permittivity, through calculation of theoretical scattering parameters at material boundaries. A constrained nonlinear optimization process was employed to minimize the discrepancy between measured transmission and reflection data with this simulated data, in lieu of a closed-form parameter inversion algorithm. Monte Carlo simulations of parameter retrieval in the presence of artificial noise have demonstrated our method’s robustness and superior noise rejection compared with a noniterative method. The precision of derived results has been improved by a factor of almost 50, compared to a closed-form extraction technique with identical input.
Citation
Hammler, J., Gallant, A. J., & Balocco, C. (2016). Free-Space Permittivity Measurement at Terahertz Frequencies with a Vector Network Analyser. IEEE Transactions on Terahertz Science & Technology, 6(6), 817-823. https://doi.org/10.1109/tthz.2016.2609204
Journal Article Type | Article |
---|---|
Acceptance Date | Sep 7, 2016 |
Online Publication Date | Oct 20, 2016 |
Publication Date | Nov 1, 2016 |
Deposit Date | May 17, 2016 |
Publicly Available Date | Oct 21, 2016 |
Journal | IEEE Transactions on Terahertz Science & Technology |
Print ISSN | 2156-342X |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 6 |
Issue | 6 |
Pages | 817-823 |
DOI | https://doi.org/10.1109/tthz.2016.2609204 |
Files
Published Journal Article (Advance online version)
(702 Kb)
PDF
Publisher Licence URL
http://creativecommons.org/licenses/by/4.0/
Copyright Statement
Advance online version This work is licensed under a Creative Commons Attribution 3.0 License.
Published Journal Article (Final published version)
(674 Kb)
PDF
Publisher Licence URL
http://creativecommons.org/licenses/by/4.0/
Copyright Statement
Final published version
You might also like
Genetic algorithms for the design of planar THz antenna
(2022)
Journal Article
Tilting micromirror platform based on liquid dielectrophoresis
(2021)
Journal Article
Programmable droplet actuating platform using liquid dielectrophoresis
(2021)
Journal Article
Computer Aided Patterning Design for Self-Assembled Microsphere Lithography (SA-MSL)
(2019)
Journal Article
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2024
Advanced Search