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Unified Framework for the Effective Rate Analysis of Wireless Communication Systems over MISO Fading Channels

You, Minglei; Sun, Hongjian; Jiang, Jing; Zhang, Jiayi

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Authors

Minglei You

Jing Jiang

Jiayi Zhang



Abstract

This paper proposes a unified framework for the effective rate analysis over arbitrary correlated and not necessarily identical multiple inputs single output (MISO) fading channels, which uses moment generating function (MGF) based approach and H transform representation. The proposed framework has the potential to simplify the cumbersome analysis procedure compared to the probability density function (PDF) based approach. Moreover, the effective rates over two specific fading scenarios are investigated, namely independent but not necessarily identical distributed (i.n.i.d.) MISO hyper Fox’s H fading channels and arbitrary correlated generalized K fading channels. The exact analytical representations for these two scenarios are also presented. By substituting corresponding parameters, the effective rates in various practical fading scenarios, such as Rayleigh, Nakagami-m, Weibull/Gamma and generalized K fading channels, are readily available. In addition, asymptotic approximations are provided for the proposed H transform and MGF based approach as well as for the effective rate over i.n.i.d. MISO hyper Fox’s H fading channels. Simulations under various fading scenarios are also presented, which support the validity of the proposed method.

Citation

You, M., Sun, H., Jiang, J., & Zhang, J. (2017). Unified Framework for the Effective Rate Analysis of Wireless Communication Systems over MISO Fading Channels. IEEE Transactions on Communications, 65(4), 1775-1785. https://doi.org/10.1109/tcomm.2016.2638901

Journal Article Type Article
Acceptance Date Dec 1, 2016
Online Publication Date Dec 13, 2016
Publication Date Apr 1, 2017
Deposit Date Dec 1, 2016
Publicly Available Date Dec 2, 2016
Journal IEEE Transactions on Communications
Print ISSN 0090-6778
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 65
Issue 4
Pages 1775-1785
DOI https://doi.org/10.1109/tcomm.2016.2638901

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© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.





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