Brunner, K.J. and Chorley, J.C. and Dipper, N.A. and Naylor, G. and Sharples, R.M. and Taylor, G. and Thomas, D.A. and Vann, R.G.L. (2016) 'Modifications to the synthetic aperture microwave imaging diagnostic.', Review of scientific instruments., 87 (11). 11E129.
Abstract
The synthetic aperture microwave imaging diagnostic has been operating on the MAST experiment since 2011. It has provided the first 2D images of B-X-O mode conversion windows and showed the feasibility of conducting 2D Doppler back-scattering experiments. The diagnostic heavily relies on field programmable gate arrays to conduct its work. Recent successes and newly gained experience with the diagnostic have led us to modify it. The enhancements will enable pitch angle profile measurements, O and X mode separation, and the continuous acquisition of 2D DBS data. The diagnostic has also been installed on the NSTX-U and is acquiring data since May 2016.
| Item Type: | Article |
|---|---|
| Full text: | (VoR) Version of Record Download PDF (695Kb) |
| Status: | Peer-reviewed |
| Publisher Web site: | https://doi.org/10.1063/1.4961283 |
| Publisher statement: | © 2016 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Brunner, K.J. and Chorley, J.C. and Dipper, N.A. and Naylor, G. and Sharples, R.M. and Taylor, G. and Thomas, D.A. and Vann, R.G.L. (2016) 'Modifications to the synthetic aperture microwave imaging diagnostic.', Review of scientific instruments., 87 (11). 11E129 and may be found at https://doi.org/10.1063/1.4961283 |
| Date accepted: | 02 August 2016 |
| Date deposited: | 08 March 2017 |
| Date of first online publication: | 14 November 2016 |
| Date first made open access: | No date available |
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