On the Influence of Increased Stator Leakage Inductance in Single Tooth Wound Synchronous Reluctance Motors

Donaghy-Spargo, C.M.; Mecrow, B.C.; Widmer, J.D.

doi:10.1109/tie.2017.2772180

On the Influence of Increased Stator Leakage Inductance in Single Tooth Wound Synchronous Reluctance Motors

Donaghy-Spargo, C.M.; Mecrow, B.C.; Widmer, J.D.

Authors

Dr Christopher Donaghy Spargo christopher.spargo@durham.ac.uk
Academic Visitor

B.C. Mecrow

J.D. Widmer

Abstract

This paper explores the leakage inductance of a single tooth wound synchronous reluctance motor and its influence on motor performance. It is shown that the stator leakage inductance heavily influences the true saliency ratio in synchronous reluctance motors and a large stator leakage inductance has a serious detrimental impact on the operating power factor. It is also shown through analytical and FEA analysis that synchronous reluctance motors with single tooth windings suffer an inherent high stator leakage inductance that is dominated the air gap harmonic leakage component, derived from the significant stator MMF harmonics experienced with this winding type. This explains for the first time the experimental results showing a low operating power factor compared to a distributed wound machine. Measurement of the stator leakage inductance is attempted on a prototyped machine and the standardized method is found to be lacking when single tooth windings are employed.

Citation

Donaghy-Spargo, C., Mecrow, B., & Widmer, J. (2018). On the Influence of Increased Stator Leakage Inductance in Single Tooth Wound Synchronous Reluctance Motors. IEEE Transactions on Industrial Electronics, 65(6), 4475 -4482. https://doi.org/10.1109/tie.2017.2772180

Journal Article Type	Article
Acceptance Date	Oct 19, 2017
Online Publication Date	Nov 13, 2017
Publication Date	Jun 1, 2018
Deposit Date	Oct 19, 2017
Publicly Available Date	Jan 26, 2018
Journal	IEEE Transactions on Industrial Electronics
Print ISSN	0278-0046
Electronic ISSN	1557-9948
Publisher	Institute of Electrical and Electronics Engineers
Peer Reviewed	Peer Reviewed
Volume	65
Issue	6
Pages	4475 -4482
DOI	https://doi.org/10.1109/tie.2017.2772180

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