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An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect

Huang, S.L.; Peng, L.S.; Wang, Q.; Wang, S.

An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect Thumbnail


Authors

S.L. Huang

L.S. Peng



Abstract

The defect opening profile recognition is of great concern in the magnetic flux leakage (MFL) measurement technique. The detected spatial MFL signal has three components: horizontal, vertical, and normal components. Horizontal and normal component signals are commonly used to estimate the defect profile, while the vertical component has always been neglected. With the development of the high resolution and the 3-D MFL testing techniques, the vertical component signal is becoming more available. This paper analyzes the essential right-angle features of the vertical component signal, which is useful for the defect opening profile recognition. After obtaining the initial profile from the horizontal or normal component, the types of the right angle is identified from the vertical component, and the opening profile is further optimized based on these right-angle features. The opening profile recognition method is put forward in this paper to improve the accuracy of the recognition result of the defect. Both simulation and experimental tests are conducted to verify the good performance of the proposed method. Compared with the opening profiles recognized merely by the horizontal component signal, the proposed method shows better recognition results, which also validates that the vertical component signal can also be a useful information for the defect estimation.

Citation

Huang, S., Peng, L., Wang, Q., & Wang, S. (2019). An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect. IEEE Transactions on Instrumentation and Measurement, 68(6), 2229-2236. https://doi.org/10.1109/tim.2018.2869438

Journal Article Type Article
Acceptance Date Aug 20, 2018
Online Publication Date Sep 26, 2018
Publication Date Jun 30, 2019
Deposit Date Sep 19, 2018
Publicly Available Date Mar 28, 2024
Journal IEEE Transactions on Instrumentation and Measurement
Print ISSN 0018-9456
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 68
Issue 6
Pages 2229-2236
DOI https://doi.org/10.1109/tim.2018.2869438

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Accepted Journal Article (1.1 Mb)
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© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.





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