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An inelastic multislice simulation method incorporating plasmon energy losses

Mendis, B.G.

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Abstract

Quantitative electron microscopy requires accurate simulation methods that take into account both elastic and inelastic scattering of the high energy electrons within the specimen. Here a method to combine plasmon excitations, the dominant energy loss mechanism in a solid, with conventional frozen phonon, multislice simulations is presented. The Monte Carlo based method estimates the plasmon scattering path length and scattering angle using random numbers and modifies the transmission and propagator functions in the multislice calculation accordingly. Comparison of energy filtered, convergent beam electron diffraction patterns in [110]-Si show good agreement between simulation and experiment. Simulations also show that plasmon excitation decreases the high angle annular dark field signal from atom columns, due to the plasmon scattering angle suppressing electron beam channeling along the atom columns. The effect on resolution and peak-to-background ratio of the atom columns is however small.

Citation

Mendis, B. (2019). An inelastic multislice simulation method incorporating plasmon energy losses. Ultramicroscopy, 206, Article 112816. https://doi.org/10.1016/j.ultramic.2019.112816

Journal Article Type Article
Acceptance Date Jul 20, 2019
Online Publication Date Jul 22, 2019
Publication Date Nov 30, 2019
Deposit Date Jul 23, 2019
Publicly Available Date Jul 22, 2020
Journal Ultramicroscopy
Print ISSN 0304-3991
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 206
Article Number 112816
DOI https://doi.org/10.1016/j.ultramic.2019.112816

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