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Energy dispersive spectroscopic measurement of charge traps in MoTe_2

Townsend, Nicola J.; Amit, Iddo; Panchal, Vishal; Kazakova, Olga; Craciun, Monica F.; Russo, Saverio

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Authors

Nicola J. Townsend

Vishal Panchal

Olga Kazakova

Monica F. Craciun

Saverio Russo



Abstract

Spectroscopic techniques are vital to determine the energy distribution of trapped states in semiconducting materials to assess the quality and efficiency of electronic devices. However, there is a need for a sensitive spectroscopic technique that can be used with atomically thin materials which are thinner than the Debye screening length as the current methods, such as deep level trap spectroscopy and admittance spectroscopy, are incompatible with the long emission times and temperature sensitivities of these materials. In this work we expand the threshold voltage transient phenomenon into an energy dispersive spectroscopic technique, dubbed the threshold voltage transient spectroscopy technique. This is applied to few-layer MoTe$_2$ with the trap concentration and subsequently the density of trap states are found in a region between the valence band edge and the midgap, which clearly shows the density of states in the tail end of the valence band.

Citation

Townsend, N. J., Amit, I., Panchal, V., Kazakova, O., Craciun, M. F., & Russo, S. (2019). Energy dispersive spectroscopic measurement of charge traps in MoTe_2. Physical review B, 100(16), Article 165310. https://doi.org/10.1103/physrevb.100.165310

Journal Article Type Article
Acceptance Date Aug 6, 2019
Online Publication Date Oct 31, 2019
Publication Date Oct 15, 2019
Deposit Date Oct 31, 2019
Publicly Available Date Nov 5, 2019
Journal Physical Review B
Print ISSN 1098-0121
Electronic ISSN 1550-235X
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 100
Issue 16
Article Number 165310
DOI https://doi.org/10.1103/physrevb.100.165310
Related Public URLs https://ore.exeter.ac.uk/repository/handle/10871/38624

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http://creativecommons.org/licenses/by/4.0/

Copyright Statement
Published by the American Physical Society under the terms of the
Creative Commons Attribution 4.0 International license. Further
distribution of this work must maintain attribution to the author(s)
and the published article’s title, journal citation, and DOI.





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