Conduction mechanisms in metal/self-assembled monolayer/metal junctions

Etor, David; Dodd, Linzi E.; Balocco, Claudio; Wood, David

doi:10.1049/mnl.2018.5747

Conduction mechanisms in metal/self-assembled monolayer/metal junctions

Etor, David; Dodd, Linzi E.; Balocco, Claudio; Wood, David

Authors

David Etor

Linzi E. Dodd

Professor Claudio Balocco claudio.balocco@durham.ac.uk
Professor

David Wood

Abstract

The conduction mechanisms in metal-insulator-metal (MIM) junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole-Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.

Citation

Etor, D., Dodd, L. E., Balocco, C., & Wood, D. (2019). Conduction mechanisms in metal/self-assembled monolayer/metal junctions. Micro and Nano Letters, 14(7), 808-811. https://doi.org/10.1049/mnl.2018.5747

Journal Article Type	Article
Publication Date	Jun 26, 2019
Deposit Date	Nov 15, 2019
Publicly Available Date	Nov 18, 2019
Journal	Micro and Nano Letters
Publisher	Institution of Engineering and Technology (IET)
Peer Reviewed	Peer Reviewed
Volume	14
Issue	7
Pages	808-811
DOI	https://doi.org/10.1049/mnl.2018.5747
Related Public URLs	http://nrl.northumbria.ac.uk/38224

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This paper is an accepted manuscript of a paper submitted to and accepted for publication in Micro & Nano Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at IET Digital Library.