A solution to the parameter selection and current static error issues with frequency shift islanding detection methods

Liu, M.H; Zhao, W.; Wang, Q.; Huang, S.L.; Shi, K.P.

doi:10.1109/tie.2020.2970684

A solution to the parameter selection and current static error issues with frequency shift islanding detection methods

Liu, M.H; Zhao, W.; Wang, Q.; Huang, S.L.; Shi, K.P.

Authors

M.H Liu

W. Zhao

Dr Qing Wang qing.wang@durham.ac.uk
Associate Professor

S.L. Huang

K.P. Shi

Abstract

Frequency shift islanding detection methods have been widely used in inverter-based distributed generations. Two representatives of such methods, Sandia frequency shift (SFS) and reactive current perturbation (RCP) methods, are investigated in this paper. The investigation reveals two main issues with these two methods, i.e., parameter selection scheme for positive feedback gain and current static error. The current parameter selection scheme, in particular, is considered unreliable and inconvenient in this paper, for it has not considered the weakening effect of PI regulators on positive feedback and the positive feedback gain is actually obtained by trial and error, which makes it difficult to use such methods well in field environments. In view of these issues, this paper proposes a solution that contains an improved method to eliminate current static error and a reliable and convenient parameter selection scheme based on system stability analyses. The final simulations and experiments verify the good performance of the improved method and the parameter selection scheme.

Citation

Liu, M., Zhao, W., Wang, Q., Huang, S., & Shi, K. (2020). A solution to the parameter selection and current static error issues with frequency shift islanding detection methods. IEEE Transactions on Industrial Electronics, 68(2), 1401-1411. https://doi.org/10.1109/tie.2020.2970684

Journal Article Type	Article
Acceptance Date	Dec 30, 2019
Online Publication Date	Feb 5, 2020
Publication Date	2020
Deposit Date	Dec 31, 2019
Publicly Available Date	Jan 3, 2020
Journal	IEEE Transactions on Industrial Electronics
Print ISSN	0278-0046
Publisher	Institute of Electrical and Electronics Engineers
Peer Reviewed	Peer Reviewed
Volume	68
Issue	2
Pages	1401-1411
DOI	https://doi.org/10.1109/tie.2020.2970684

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