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Angular dependence of fast-electron scattering from materials

Barthel, Juri; Cattaneo, Mauricio; Mendis, Budhika G.; Findlay, Scott D.; Allen, Leslie J.

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Authors

Juri Barthel

Mauricio Cattaneo

Scott D. Findlay

Leslie J. Allen



Abstract

Angular resolved scanning transmission electron microscopy is an important tool for investigating the properties of materials. However, several recent studies have observed appreciable discrepancies in the angular scattering distribution between experiment and theory. In this paper we discuss a general approach to low-loss inelastic scattering which, when incorporated in the simulations, resolves this problem and also closely reproduces experimental data taken over an extended angular range. We also explore the role of ionic bonding, temperature factors, amorphous layers on the surfaces of the specimen, and static displacements of atoms on the angular scattering distribution. The incorporation of low-loss inelastic scattering in simulations will improve the quantitative usefulness of techniques such as low-angle annular dark-field imaging and position-averaged convergent beam electron diffraction, especially for thicker specimens.

Citation

Barthel, J., Cattaneo, M., Mendis, B. G., Findlay, S. D., & Allen, L. J. (2020). Angular dependence of fast-electron scattering from materials. Physical Review B, 101(18), Article 184109. https://doi.org/10.1103/physrevb.101.184109

Journal Article Type Article
Online Publication Date May 12, 2020
Publication Date May 31, 2020
Deposit Date May 15, 2020
Publicly Available Date Mar 29, 2024
Journal Physical Review B
Print ISSN 2469-9950
Electronic ISSN 2469-9969
Publisher American Physical Society
Peer Reviewed Peer Reviewed
Volume 101
Issue 18
Article Number 184109
DOI https://doi.org/10.1103/physrevb.101.184109

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Copyright Statement
Reprinted with permission from the American Physical Society: Barthel, Juri, Cattaneo, Mauricio, Mendis, Budhika G., Findlay, Scott D. & Allen, Leslie J. (2020). Angular dependence of fast-electron scattering from materials. Physical Review B 101(18): 184109 © 2020 by the American Physical Society. Readers may view, browse, and/or download material for temporary copying purposes only, provided these uses are for noncommercial personal purposes. Except as provided by law, this material may not be further reproduced, distributed, transmitted, modified, adapted, performed, displayed, published, or sold in whole or part, without prior written permission from the American Physical Society.





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