J. Alvarez-Lares
Image reconstruction using RAPID Algorithm with Time-Frequency analysis
Alvarez-Lares, J.; Wang, Q.
Abstract
The detection of cracks is crucial in some industries, such as petroleum and aerospace. In order to detect these cracks, a modification to the Reconstruction Algorithm for Probabilistic Inspection Damage (RAPID) has been proposed. This modification consists of comparing the time-frequency content of the signals instead of only analysing their waveforms. This analysis has some advantages over the usual analysis, such as filtering the signal and observing the behaviour of defects with different frequencies. The results of this experiment show the ability of this new approach to localize defects agreeing with the real position of the defect. However, the shape detection of this approach needs to be improved. Nevertheless, the modification presented in this paper shows great potential and with further work it is possible to obtain better results.
Citation
Alvarez-Lares, J., & Wang, Q. (2020). Image reconstruction using RAPID Algorithm with Time-Frequency analysis. . https://doi.org/10.1109/iciea48937.2020.9248181
Conference Name | The 15th IEEE Conference on Industrial Electronics and Applications |
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Conference Location | Kristiansand, Norway |
Start Date | Nov 9, 2020 |
End Date | Nov 13, 2020 |
Acceptance Date | Jun 1, 2020 |
Online Publication Date | Nov 9, 2020 |
Publication Date | Nov 9, 2020 |
Deposit Date | Dec 18, 2020 |
Publicly Available Date | Jan 4, 2021 |
Series ISSN | 2158-2297 |
DOI | https://doi.org/10.1109/iciea48937.2020.9248181 |
Publisher URL | https://ieeexplore.ieee.org/document/9248181 |
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