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Cross-modal Image Synthesis in Dual-Energy X-Ray Security Imagery

Isaac-Medina, B.K.S.; Bhowmik, N.; Willcocks, C.G.; Breckon, T.P.

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Abstract

Dual-energy X-ray scanners are used for aviation security screening given their capability to discriminate materials inside passenger baggage. To facilitate manual operator inspection, a pseudo-colouring is assigned to the effective composition of the material. Recently, paired image to image translation models based on conditional Generative Adversarial Networks (cGAN) have shown to be effective for image colourisation. In this work, we investigate the use of such a model to translate from the raw X-ray energy responses (high, low, effective-Z) to the pseudo-coloured images and vice versa. Specifically, given N X-ray modalities, we train a cGAN conditioned in N − m domains to generate the remaining m representation. Our method achieves a mean squared error (MSE) of 16.5 and a structural similarity index (SSIM) of 0.9815 when using the raw modalities to generate the pseudo-colour representation. Additionally, raw X-ray high energy, low energy and effective-Z projections were generated given the pseudo-colour image with minimum MSE of 2.57, 5.63 and 1.43, and maximum SSIM of 0.9953, 0.9901 and 0.9921. Furthermore, we assess the quality of our synthesised pseudo-colour reconstructions by measuring the performance of two object detection models originally trained on real X-ray pseudo-colour images over our generated pseudo-colour images. Interestingly, our generated pseudo-colour images obtain marginally improved detection performance than the corresponding real X-ray pseudo-colour images, showing that meaningful representations are synthesized and that these reconstructions are applicable for differing aviation security tasks.

Citation

Isaac-Medina, B., Bhowmik, N., Willcocks, C., & Breckon, T. (2022). Cross-modal Image Synthesis in Dual-Energy X-Ray Security Imagery. . https://doi.org/10.1109/cvprw56347.2022.00048

Conference Name 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
Conference Location New Orleans, Louisiana
Start Date Jun 19, 2022
End Date Jun 24, 2022
Acceptance Date Apr 11, 2022
Online Publication Date Jun 18, 2022
Publication Date 2022-06
Deposit Date May 4, 2022
Publicly Available Date Mar 29, 2024
Publisher Institute of Electrical and Electronics Engineers
ISBN 9781665487405
DOI https://doi.org/10.1109/cvprw56347.2022.00048

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