Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts

Mendis, Budhika G.; Talmantaite, Alina

doi:10.1017/s1431927622012223

Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts

Mendis, Budhika G.; Talmantaite, Alina

Authors

Dr Buddhika Mendis b.g.mendis@durham.ac.uk
Associate Professor

Alina Talmantaite

Abstract

The Compton signal in electron energy loss spectroscopy (EELS) is used to determine the projected electron momentum density of states for the solid. A frequent limitation however is the strong dynamical scattering of the incident electron beam within a crystalline specimen, i.e. Bragg diffracted beams can be additional sources of Compton scattering that distort the measured profile from its true shape. The Compton profile is simulated via a multislice method that models dynamical scattering both before and after the Compton energy loss event. Simulations indicate the importance of both the specimen illumination condition and EELS detection geometry. Based on this, a strategy to minimize diffraction artifacts is proposed and verified experimentally. Furthermore, an inversion algorithm to extract the projected momentum density of states from a Compton measurement performed under strong diffraction conditions is demonstrated. The findings enable a new route to more accurate electron Compton data from crystalline specimens.

Citation

Mendis, B. G., & Talmantaite, A. (2022). Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts. Microscopy and Microanalysis, https://doi.org/10.1017/s1431927622012223

Journal Article Type	Article
Acceptance Date	Jun 26, 2022
Online Publication Date	Sep 5, 2022
Publication Date	2022
Deposit Date	Sep 21, 2022
Publicly Available Date	Sep 22, 2022
Journal	Microscopy and Microanalysis
Print ISSN	1431-9276
Electronic ISSN	1435-8115
Publisher	Cambridge University Press
Peer Reviewed	Peer Reviewed
DOI	https://doi.org/10.1017/s1431927622012223

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Copyright Statement
© The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America. This is an Open Access article, distributed under the terms of the
Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the
original work is properly cited.