Background subtraction in electron Compton spectroscopy

Mendis, B.G.

doi:10.1016/j.micron.2022.103363

Background subtraction in electron Compton spectroscopy

Mendis, B.G.

Authors

Dr Buddhika Mendis b.g.mendis@durham.ac.uk
Associate Professor

Abstract

Compton scattering in electron energy loss spectroscopy (EELS) is used to quantify the momentum distribution of occupied electronic states in a solid. The Compton signal is a broad feature with a width of several hundred eV. Furthermore, the weak intensity results in a low peak-to-background ratio. Removing the background under the Compton profile is therefore particularly challenging, especially if there is an overlap with EELS core loss edges. Here an empirical background subtraction routine is proposed that uses input data from a bright-field EELS spectrum that does not have a Compton signal. The routine allows for multiple elastic-inelastic scattering within the EELS collection angles. Background subtraction is demonstrated on a Compton profile in silicon that overlaps with the Si L-edge. Systematic errors in the method are also discussed.

Citation

Mendis, B. (2022). Background subtraction in electron Compton spectroscopy. Micron, 163, Article 103363. https://doi.org/10.1016/j.micron.2022.103363

Journal Article Type	Article
Acceptance Date	Sep 27, 2022
Online Publication Date	Oct 13, 2022
Publication Date	2022-12
Deposit Date	Oct 13, 2022
Publicly Available Date	Oct 13, 2022
Journal	Micron
Print ISSN	0968-4328
Publisher	Elsevier
Peer Reviewed	Peer Reviewed
Volume	163
Article Number	103363
DOI	https://doi.org/10.1016/j.micron.2022.103363

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Copyright Statement
© 2022 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/)