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An Enhanced Analysis of Inter-Laminar Faults in Magnetic Cores with Grain Oriented Electrical Steels for Fault Diagnosis and Condition Monitoring: Theoretical Background and Experimental Verification

Hamzehbahmani, Hamed

An Enhanced Analysis of Inter-Laminar Faults in Magnetic Cores with Grain Oriented Electrical Steels for Fault Diagnosis and Condition Monitoring: Theoretical Background and Experimental Verification Thumbnail


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Abstract

Fault diagnosis and condition monitoring of electromagnetic devices are the strategies for monitoring and processing parameters of the device for fault identification and failure prediction. In this respect, core faults or inter-laminar faults (ILFs) are a key objective, with an important contribution to the whole process. This article tends to propose a new experimental-analytical approach to fault diagnosis and condition monitoring of magnetic cores. The proposed technique is in line with the phenomenology of magnetic hysteresis and interpreting the dynamic characteristics of the magnetic cores. The distinct feature of this approach is its ability to model additional magnetic fields and associated energy loss caused by ILFs. The studies were carried out on stacks of standard Epstein size strips of 3 wt% SiFe grain oriented (GO) steels, subjected to artificial faults. Validation of the developed approach was undertaken through experimental work and analytical modeling.

Citation

Hamzehbahmani, H. (2023). An Enhanced Analysis of Inter-Laminar Faults in Magnetic Cores with Grain Oriented Electrical Steels for Fault Diagnosis and Condition Monitoring: Theoretical Background and Experimental Verification. IEEE Transactions on Instrumentation and Measurement, 72, Article 6002610. https://doi.org/10.1109/tim.2023.3253882

Journal Article Type Article
Online Publication Date Mar 8, 2023
Publication Date 2023
Deposit Date Mar 1, 2023
Publicly Available Date Mar 23, 2023
Journal IEEE Transactions on Instrumentation and Measurement
Print ISSN 0018-9456
Electronic ISSN 1557-9662
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 72
Article Number 6002610
DOI https://doi.org/10.1109/tim.2023.3253882
Public URL https://durham-repository.worktribe.com/output/1178126

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