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X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review

Tanner, Brian K.

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Abstract

A short review of X-ray topographic studies of crystals grown from solution is presented. The dislocation configurations characteristic of such crystals are described, and Klapper’s explanation in terms of minimization of the elastic energy of a dislocation per unit growth length is highlighted. It is shown that the principles apply to crystals grown not only from low temperature solution but also by hydrothermal growth and growth from fluxed melts. Recent studies of growth of protein crystals have found that they have similar dislocation configurations and characteristics to those of ionic and small organic molecule crystals grown from solution.

Citation

Tanner, B. K. (2023). X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review. Crystal Growth and Design, 23(4), 3026-3033. https://doi.org/10.1021/acs.cgd.2c01463

Journal Article Type Article
Online Publication Date Mar 10, 2023
Publication Date 2023
Deposit Date Apr 20, 2023
Publicly Available Date Apr 20, 2023
Journal Crystal Growth & Design
Print ISSN 1528-7483
Electronic ISSN 1528-7505
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 23
Issue 4
Pages 3026-3033
DOI https://doi.org/10.1021/acs.cgd.2c01463

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